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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optics for Arts, Architecture, and Archaeology IV - SYDDARTA: new methodology for digitization of deterioration estimation in paintings
Granero-Montagud, Luís, Pezzati, Luca, Targowski, Piotr, Portalés, Cristina, Pastor-Carbonell, Begoña, Ribes-Gómez, Emilio, Gutiérrez-Lucas, Antonio, Tornari, Vivi, Papadakis, Vassilis, Groves, RogerVolume:
8790
Year:
2013
Language:
english
DOI:
10.1117/12.2020333
File:
PDF, 415 KB
english, 2013