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Ultra-low noise characteristics of millimeter-wave high electron mobility transistors
Duh, K.-H.G., Liu, S.-M.J., Lester, L.F., Chao, P.C., Smith, P.M., Das, M.B., Lee, B.R., Ballingall, J.Volume:
9
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.17831
Date:
October, 1988
File:
PDF, 268 KB
english, 1988