SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Machine Vision Applications in Industrial Inspection XII - CCD cameras as thermal imaging Devices in heat treatment processes

Zauner, Gerald, Heim, Daniel, Niel, Kurt, Hendorfer, Gunther, Stoeri, Herbert, Price, Jeffery R., Meriaudeau, Fabrice
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Volume:
5303
Year:
2004
Language:
english
DOI:
10.1117/12.526339
File:
PDF, 510 KB
english, 2004
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