Desorption−Ionization Mass Spectrometry Using Deposited...

Analytical Chemistry 2001 / 03 Vol. 73; Iss. 6

Desorption−Ionization Mass Spectrometry Using Deposited Nanostructured Silicon Films

Cuiffi, Joseph D., Hayes, Daniel J., Fonash, Stephen J., Brown, Kwanza N., Jones, Arthur D.
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Volume:
73
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac001081k
Date:
March, 2001
File:
PDF, 51 KB
english, 2001
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