Probing bias stress effect and contact resistance in bilayer ambipolar organic field-effect transistors
Yan, Yan, Sun, Qi-Jun, Gao, Xu, Deng, Ping, Zhang, Qing, Wang, Sui-DongVolume:
103
Year:
2013
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4818644
File:
PDF, 1.84 MB
english, 2013