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Probing bias stress effect and contact resistance in...

Probing bias stress effect and contact resistance in bilayer ambipolar organic field-effect transistors

Yan, Yan, Sun, Qi-Jun, Gao, Xu, Deng, Ping, Zhang, Qing, Wang, Sui-Dong
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Volume:
103
Year:
2013
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4818644
File:
PDF, 1.84 MB
english, 2013
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