[IEEE Tenth Asian Test Symposium - Kyoto, Japan (19-21 Nov. 2001)] Proceedings 10th Asian Test Symposium - A microcode-based memory BIST implementing modified march algorithm
Dongkyu Youn,, Taehyung Kim,, Sungju Park,Year:
2001
Language:
english
DOI:
10.1109/ATS.2001.990315
File:
PDF, 408 KB
english, 2001