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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - Direct evaluation of DC characteristic variability in FinFET SRAM Cell for 32 nm node and beyond
Inaba, Satoshi, Kawasaki, Hirohisa, Okano, Kimitoshi, Izumida, Takashi, Yagishita, Atsushi, Kaneko, Akio, Ishimaru, Kazunari, Aoki, Nobutoshi, Toyoshima, YoshiakiYear:
2007
Language:
english
DOI:
10.1109/IEDM.2007.4418980
File:
PDF, 1.99 MB
english, 2007