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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - The interfacial properties of AOF/ZnS and LWIR bulk HgCdTe materials by MIS structures
Wang, Nili, Liu, Shijia, Lan, Tianyi, Zhao, Shuiping, Jiang, Peilu, Li, Xiangyang, Jiang, Yadong, Yu, Junsheng, Wang, ZhifengVolume:
8419
Year:
2012
Language:
english
DOI:
10.1117/12.975117
File:
PDF, 247 KB
english, 2012