Characterization of Microporous Silicon Fabricated by Immersion Scanning
Bassous, E., Freeman, M., Halbout, J.-M., lyer, S. S., Kesan, V. P., Munguia, P., Pesarcik, S. F., Williams, B. L.Volume:
256
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-256-23
Date:
January, 1991
File:
PDF, 214 KB
english, 1991