Characterization of Semiconductor Heterostructures and Nanostructures || Grazing Incidence Diffraction Anomalous Fine Structure in the Study of Structural Properties of Nanostructures
Renevier, H.Year:
2013
Language:
english
DOI:
10.1016/B978-0-444-59551-5.00008-X
File:
PDF, 1.71 MB
english, 2013