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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Dimensional Optical Metrology and Inspection for Practical Applications II - Characterization of the optical components fabricated by femtosecond pulses in transparent materials
Mazule, Lina, Liukaityte, Simona, Sabonis, Vytautas, Gertus, Titas, Mikutis, Mindaugas, Paipulas, Domas, Puodziunas, Tomas, Sirutkaitis, Valdas, Harding, Kevin G., Huang, Peisen S., Yoshizawa, ToruVolume:
8839
Year:
2013
Language:
english
DOI:
10.1117/12.2022823
File:
PDF, 2.09 MB
english, 2013