Single-Event Burnout Hardening of Power UMOSFETs With...

IEEE Transactions on Electron Devices 2013 / 06 Vol. 60; Iss. 6

Single-Event Burnout Hardening of Power UMOSFETs With Optimized Structure

Wang, Ying, Zhang, Yue, Wang, Li-Guo, Yu, Chenghao
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2256426
Date:
June, 2013
File:
PDF, 786 KB
english, 2013
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