FT-IR characterization of SiH bonds on the surface of silicon carbide.
P. Quintard, G. Ramis, M. Cauchetier, G. Busca, V. LorenzelliVolume:
174
Year:
1988
Language:
english
Pages:
6
DOI:
10.1016/0022-2860(88)80186-8
File:
PDF, 289 KB
english, 1988