FT-IR characterization of SiH bonds on the surface of...

FT-IR characterization of SiH bonds on the surface of silicon carbide.

P. Quintard, G. Ramis, M. Cauchetier, G. Busca, V. Lorenzelli
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Volume:
174
Year:
1988
Language:
english
Pages:
6
DOI:
10.1016/0022-2860(88)80186-8
File:
PDF, 289 KB
english, 1988
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