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[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Predictive Modeling of the NBTI Effect for Reliable Design
Bhardwaj, Sarvesh, Wang, Wenping, Vattikonda, Rakesh, Cao, Yu, Vrudhula, SarmaYear:
2006
Language:
english
DOI:
10.1109/CICC.2006.320885
File:
PDF, 2.67 MB
english, 2006