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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection
Sen-Wen Hsiao,, Tzou, Nicholas, Chatterjee, A.Year:
2013
Language:
english
DOI:
10.1109/VTS.2013.6548912
File:
PDF, 3.00 MB
english, 2013