Effects of Plasma Processing Parameters on the Surface Reactivity of OH(X 2 Π) in Tetraethoxysilane/O 2 Plasmas during Deposition of SiO 2
Bogart, K. H. A., Cushing, J. P., Fisher, Ellen R.Volume:
101
Language:
english
Journal:
The Journal of Physical Chemistry B
DOI:
10.1021/jp971596o
Date:
November, 1997
File:
PDF, 239 KB
english, 1997