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[IEEE 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Crete, Greece (2007.07.8-2007.07.11)] 13th IEEE International On-Line Testing Symposium (IOLTS 2007) - Embedding test patterns into Low-Power BIST sequences
Voyiatzis, IoannisYear:
2007
Language:
english
DOI:
10.1109/IOLTS.2007.29
File:
PDF, 138 KB
english, 2007