Investigation of the thermal properties of thin solid...

Microelectronics Journal 2014 / 05 Vol. 45; Iss. 5

Investigation of the thermal properties of thin solid materials at different temperature levels using a set of microresistors

Assy, Ali, Gomès, Séverine, Chantrenne, Patrice, Pavy, Nicolas, Parasuraman, Jayalakshmi, Kleber, Xavier, Basset, Philippe
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Volume:
45
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2013.08.006
Date:
May, 2014
File:
PDF, 1.76 MB
english, 2014
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