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[IEEE 2012 IEEE 18th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Alba Iulia, Romania (2012.10.25-2012.10.28)] 2012 IEEE 18th International Symposium for Design and Technology in Electronic Packaging (SIITME) - Software in the Loop environment reliability for testing embedded code
Muresan, Marius, Pitica, DanYear:
2012
Language:
english
DOI:
10.1109/SIITME.2012.6384402
File:
PDF, 542 KB
english, 2012