SPIE Proceedings [SPIE Applications in Optical Science and Engineering - Boston, MA (Sunday 15 November 1992)] Model-Based Vision - Maximum entropy and minimum cross-entropy methods in image processing
Toma, Cristian E., Datcu, Mihai P., Nasr, Hatem N., Larson, Rodney M.Volume:
1827
Year:
1993
Language:
english
DOI:
10.1117/12.143059
File:
PDF, 1.51 MB
english, 1993