60-GHz Near-Field Six-Port Microscope Using a Scanning Slit...

IEEE Sensors Journal 2012 / 08 Vol. 12; Iss. 8

60-GHz Near-Field Six-Port Microscope Using a Scanning Slit Probe for Subsurface Sensing

Haddadi, Kamel, Lasri, Tuami
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Volume:
12
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2012.2197197
Date:
August, 2012
File:
PDF, 361 KB
english, 2012
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