Gettering in high resistive float zone silicon wafers for...

Gettering in high resistive float zone silicon wafers for silicon detector applications

Li, Z., Kranar, H.W.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.34451
Date:
January, 1989
File:
PDF, 351 KB
english, 1989
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