Redox characterization of semiconductors based on...

Physical Chemistry Chemical Physics 2013 Vol. 15; Iss. 34

Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

Świętek, Elżbieta, Pilarczyk, Kacper, Derdzińska, Justyna, Szaciłowski, Konrad, Macyk, Wojciech
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Volume:
15
Year:
2013
Language:
english
Journal:
Physical Chemistry Chemical Physics
DOI:
10.1039/C3CP52129J
File:
PDF, 1.83 MB
english, 2013
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