[IEEE 2009 International Conference on Test and Measurement...

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[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - Research about human face recognition technology

Chenggang Zhen,, Yingmei Su,
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Year:
2009
Language:
english
DOI:
10.1109/ICTM.2009.5412901
File:
PDF, 526 KB
english, 2009
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