[IEEE Factory Automation (ETFA 2008) - Hamburg, Germany (2008.09.15-2008.09.18)] 2008 IEEE International Conference on Emerging Technologies and Factory Automation - Using neural networks for quality management
Jaber, Mohamad, Combaz, Jacques, Strus, LoicYear:
2008
Language:
english
DOI:
10.1109/ETFA.2008.4638586
File:
PDF, 409 KB
english, 2008