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In-situ FTIR emission spectroscopy in a technological environment: chemical vapour infiltration (CVI) of SiC composites
V Hopfe, H Mosebach, M Erhard, M MeyerVolume:
347
Year:
1995
Language:
english
Pages:
12
DOI:
10.1016/0022-2860(95)08555-a
File:
PDF, 732 KB
english, 1995