In-situ FTIR emission spectroscopy in a technological...

In-situ FTIR emission spectroscopy in a technological environment: chemical vapour infiltration (CVI) of SiC composites

V Hopfe, H Mosebach, M Erhard, M Meyer
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Volume:
347
Year:
1995
Language:
english
Pages:
12
DOI:
10.1016/0022-2860(95)08555-a
File:
PDF, 732 KB
english, 1995
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