Raman study of ferroelectric bismuth layer-oxides ABi4Ti4O15
S. Kojima, R. Imaizumi, S. Hamazaki, M. TakashigeVolume:
348
Year:
1995
Language:
english
Pages:
4
DOI:
10.1016/0022-2860(95)08583-h
File:
PDF, 297 KB
english, 1995