Thermal Stress Induced Thin Film Transfer from Single-crystal Silicon Layer on Sapphire Substrate
Lo, F. S., Hsu, R. Y., Ho, C. -C., Li, C., Lee, T. -H.Volume:
144
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584587.2013.787273
Date:
January, 2013
File:
PDF, 505 KB
english, 2013