SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Modeling and Simulation for Defense Systems and Applications VIII - An extended analytical Bayesian framework for comparison of disparate test articles
Jaenisch, Holger M., Handley, James W., Kelmelis, Eric J.Volume:
8752
Year:
2013
Language:
english
DOI:
10.1117/12.2012415
File:
PDF, 812 KB
english, 2013