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A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors
Prijić, A, Danković, D, Vračar, Lj, Manić, I, Prijić, Z, Stojadinović, NVolume:
23
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/23/8/085003
Date:
August, 2012
File:
PDF, 602 KB
english, 2012