A method for negative bias temperature instability (NBTI)...

Measurement Science and Technology 2012 / 08 Vol. 23; Iss. 8

A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors

Prijić, A, Danković, D, Vračar, Lj, Manić, I, Prijić, Z, Stojadinović, N
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Volume:
23
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/23/8/085003
Date:
August, 2012
File:
PDF, 602 KB
english, 2012
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