Research of Single-Event Burnout in Power UMOSFETs

IEEE Transactions on Electron Devices 2013 / 02 Vol. 60; Iss. 2

Research of Single-Event Burnout in Power UMOSFETs

Wang, Ying, Zhang, Yue, Yu, Chenghao
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2012.2234126
Date:
February, 2013
File:
PDF, 384 KB
english, 2013
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