SPIE Proceedings [SPIE 1988 Semiconductor Symposium - Newport Beach, CA (Monday 14 March 1988)] Spectroscopic Characterization Techniques for Semiconductor Technology III - Photoreflectance And The Seraphin Coefficients In Quantum Well Structures
Zheng, X. L., Helman, D., Lax, B., Chambers, F. A., Glembocki, Orest J., Pollak, Fred H., Ponce, Fernando A.Volume:
946
Year:
1988
Language:
english
DOI:
10.1117/12.947411
File:
PDF, 298 KB
english, 1988