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[IEEE 2007 IEEE International Conference on Microelectronic Test Structures - Bunkyo-ku, Japan (2007.03.19-2007.03.22)] 2007 IEEE International Conference on Microelectronic Test Structures - A Transmission-Line Based Technique for De-Embedding Noise Parameters

Yau, Kenneth H. K., Mangan, Alain M., Chevalier, Pascal, Schvan, Peter, Voinigescu, Sorin P.
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Year:
2007
Language:
english
DOI:
10.1109/ICMTS.2007.374491
File:
PDF, 3.33 MB
english, 2007
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