[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Impact of NBTI Induced Statistical Variation to SRAM Cell Stability
Rosa, Giuseppe, Ng, Wee, Rauch, Stewart, Wong, Robert, Sudijono, JohnYear:
2006
Language:
english
DOI:
10.1109/RELPHY.2006.251228
File:
PDF, 1.66 MB
english, 2006