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Characterization of ultrathin insulating Al[sub 2]O[sub 3] films grown on Nb(110)/sapphire(0001) by tunneling spectroscopy and microscopy
Dietrich, Ch., Boyen, H.-G., Koslowski, B.Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1586984
File:
PDF, 765 KB
english, 2003