Hot-carrier charge trapping and trap generation in HfO[sub 2] and Al[sub 2]O[sub 3] field-effect transistors
Kumar, Arvind, Fischetti, Massimo V., Ning, Tak H., Gusev, EvgeniVolume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1586985
File:
PDF, 486 KB
english, 2003