The resistive switching in TiO2 films studied by conductive...

AIP Advances 2013 Vol. 3; Iss. 8

The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

Du, Yuanmin, Kumar, Amit, Pan, Hui, Zeng, Kaiyang, Wang, Shijie, Yang, Ping, Wee, Andrew Thye Shen
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Volume:
3
Year:
2013
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4818119
File:
PDF, 1.32 MB
english, 2013
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