![](/img/cover-not-exists.png)
[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling
Merelle, T., Curatola, G., Nackaerts, A., Collaert, N., van Dal, M.J.H., Doornbos, G., Doorn, T.S., Christie, P., Vellianitis, G., Duriez, B., Duffy, R., Pawlak, B.J., Voogt, F.C., Rooyackers, R., WitYear:
2008
Language:
english
DOI:
10.1109/IEDM.2008.4796662
File:
PDF, 1.86 MB
english, 2008