SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy - An automatic measuring system for the lifetime testing of infrared detectors
Cao, Lan, Zhang, Haiyan, Zhu, Xianliang, Gong, Haimei, Jiang, Yadong, Yu, Junsheng, Wang, ZhifengVolume:
8419
Year:
2012
Language:
english
DOI:
10.1117/12.975762
File:
PDF, 199 KB
english, 2012