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[IEEE 2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS) - Wanchai, Hong Kong, China (2010.01.24-2010.01.28)] 2010 IEEE 23rd International Conference on Micro Electro Mechanical Systems (MEMS) - Thermal and topological characterization of Au, Ru and Au/Ru based MEMS contacts using nanoindenter
Broue, Adrien, Dhennin, Jeremie, Courtade, Frederic, Charvet, Pierre-Louis, Pons, Patrick, Lafontan, Xavier, Plana, RobertYear:
2010
DOI:
10.1109/MEMSYS.2010.5442444
File:
PDF, 992 KB
2010