SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] O3A: Optics for Arts, Architecture, and Archaeology III - Importance of integrated results of different non-destructive techniques in order to evaluate defects in panel paintings: the contribution of infrared, optical and ultrasonic techniques

Sfarra, S., Theodorakeas, P., Ibarra-Castanedo, C., Avdelidis, N. P., Paoletti, A., Paoletti, D., Hrissagis, K., Bendada, A., Koui, M., Maldague, X., Pezzati, Luca, Salimbeni, Renzo
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Volume:
8084
Year:
2011
Language:
english
DOI:
10.1117/12.889335
File:
PDF, 12.13 MB
english, 2011
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