Combined Synchrotron XRD/Raman Measurements:...

Langmuir 2010 / 07 Vol. 26; Iss. 13

Combined Synchrotron XRD/Raman Measurements: In Situ Identification of Polymorphic Transitions during Crystallization Processes

Klimakow, Maria, Leiterer, Jork, Kneipp, Janina, Rössler, Ernst, Panne, Ulrich, Rademann, Klaus, Emmerling, Franziska
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
26
Language:
english
Journal:
Langmuir
DOI:
10.1021/la100540q
Date:
July, 2010
File:
PDF, 2.75 MB
english, 2010
Conversion to is in progress
Conversion to is failed