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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - 3D-susceptibility evaluation of actual housings of electronic equipment using rotating EM fields
Murano, K., Tayarani, M., Xiao, F., Kami, Y.Volume:
1
Year:
2004
Language:
english
DOI:
10.1109/ISEMC.2004.1350002
File:
PDF, 360 KB
english, 2004