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Low-Voltage Dark-Field STEM Imaging with Optimum Detection Angle
Morikawa, A, Kamiya, C, Watanabe, S, Nakagawa, M, Ishitani, TVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927606067821
Date:
August, 2006
File:
PDF, 924 KB
english, 2006