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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing - Using liquid crystal spatial light modulators with binary power spectrum in pattern recognition system
Liu, Chengyu, Chen, Chulung, Liao, Weichih, Fu, Sihliang, Lin, Xiangdi, Namba, Yoshiharu, Xing, TingwenVolume:
8420
Year:
2012
Language:
english
DOI:
10.1117/12.2008752
File:
PDF, 363 KB
english, 2012