SPIE Proceedings [SPIE 32nd Annual Technical Symposium -...

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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Statistical Optics - Aberration Correction Of Speckled Imagery With An Image-Sharpness Criterion

Paxman, R G., Marron, J. C., Morris, G. Michael
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Volume:
976
Year:
1988
Language:
english
DOI:
10.1117/12.948527
File:
PDF, 2.03 MB
english, 1988
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