[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - A highly integrated 65-nm SoC process with enhanced power/performance of digital and analog circuits
Clark, L. T., Zhao, D., Bakhishev, T., Ahn, H., Boling, E., Duane, M., Fujita, K., Gregory, P., Hoffmann, T., Hori, M., Kanai, D., Kidd, D., Lee, S., Liu, Y., Mitani, J., Nagayama, J., Pradhan, S., RaYear:
2012
Language:
english
DOI:
10.1109/IEDM.2012.6479042
File:
PDF, 3.06 MB
english, 2012