SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications III - Smart sensor for surface inspection: concepts and prototype description
Poujouly, Stephane, Journet, Bernard A., Blouke, Morley M., Canosa, John, Sampat, NitinVolume:
4669
Year:
2002
Language:
english
DOI:
10.1117/12.463426
File:
PDF, 111 KB
english, 2002