[IEEE 2013 IEEE 26th International Conference on Micro...

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[IEEE 2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS) - Taipei, Taiwan (2013.01.20-2013.01.24)] 2013 IEEE 26th International Conference on Micro Electro Mechanical Systems (MEMS) - Integrated micro Wobbe index meter towards on-chip energy content measurement

Lotters, J. C., Lammerink, T. S. J., Pap, M. G., Sanders, R. G. P., de Boer, M. J., Mouris, A. J., Wiegerink, R. J.
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Year:
2013
Language:
english
DOI:
10.1109/MEMSYS.2013.6474407
File:
PDF, 648 KB
english, 2013
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