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SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Measurement method for the transition width of precision approach path indicator based on spectral means
Shen, Haiping, Zhou, Xiaoli, Zhang, Wanlu, Pan, Jiangen, Liu, Muqing, Zhang, Yudong, Xiang, Libin, To, SandyVolume:
8417
Year:
2012
Language:
english
DOI:
10.1117/12.980254
File:
PDF, 2.68 MB
english, 2012